April 17, 2024, 4:42 a.m. | Adarsha Balaji, Ramyad Hadidi, Gregory Kollmer, Mohammed E. Fouda, Prasanna Balaprakash

cs.LG updates on arXiv.org arxiv.org

arXiv:2404.10689v1 Announce Type: new
Abstract: X-ray and electron diffraction-based microscopy use bragg peak detection and ptychography to perform 3-D imaging at an atomic resolution. Typically, these techniques are implemented using computationally complex tasks such as a Psuedo-Voigt function or solving a complex inverse problem. Recently, the use of deep neural networks has improved the existing state-of-the-art approaches. However, the design and development of the neural network models depends on time and labor intensive tuning of the model by application experts. …

3-d abstract applications architecture arxiv cs.lg detection eess.sp electron function imaging microscopy network network architecture networks neural networks peak ray resolution scientific search tasks type x-ray

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