Web: http://arxiv.org/abs/2201.12184

Jan. 31, 2022, 2:11 a.m. | Mathé T. Zeegers, Tristan van Leeuwen, Daniël M. Pelt, Sophia Bethany Coban, Robert van Liere, Kees Joost Batenburg

cs.LG updates on arXiv.org arxiv.org

Detection of unwanted (`foreign') objects within products is a common
procedure in many branches of industry for maintaining production quality.
X-ray imaging is a fast, non-invasive and widely applicable method for foreign
object detection. Deep learning has recently emerged as a powerful approach for
recognizing patterns in radiographs (i.e., X-ray images), enabling automated
X-ray based foreign object detection. However, these methods require a large
number of training examples and manual annotation of these examples is a
subjective and laborious task. …

arxiv cv deep deep learning detection learning workflow x-ray

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