An Incremental Phase Mapping Approach for X-ray Diffraction Patterns using Binary Peak Representations. (arXiv:2211.04011v1 [cs.LG])

Despite the huge advancement in knowledge discovery and data mining
techniques, the X-ray diffraction (XRD) analysis process has mostly remained
untouched and still involves manual investigation, comparison, and
verification. Due to the large volume of XRD samples from high-throughput XRD
experiments, it has become impossible for domain scientists to process them
manually. Recently, they have started leveraging standard clustering
techniques, to reduce the XRD pattern representations requiring manual efforts
for labeling and verification. Nevertheless, these standard clustering
techniques do not …

arxiv binary incremental mapping patterns peak ray x-ray