April 17, 2023, 8:02 p.m. | Vipul Arora, Arnab Bhattacharyya, Clément L. Canonne, Joy Qiping Yang

cs.LG updates on arXiv.org arxiv.org

This paper considers the problem of testing the maximum in-degree of the
Bayes net underlying an unknown probability distribution $P$ over $\{0,1\}^n$,
given sample access to $P$. We show that the sample complexity of the problem
is $\tilde{\Theta}(2^{n/2}/\varepsilon^2)$. Our algorithm relies on a
testing-by-learning framework, previously used to obtain sample-optimal
testers; in order to apply this framework, we develop new algorithms for
``near-proper'' learning of Bayes nets, and high-probability learning under
$\chi^2$ divergence, which are of independent interest.

algorithm algorithms apply arxiv bayes complexity distribution divergence framework independent near paper probability show testing

Data Engineer

@ Bosch Group | San Luis Potosí, Mexico

DATA Engineer (H/F)

@ Renault Group | FR REN RSAS - Le Plessis-Robinson (Siège)

Advisor, Data engineering

@ Desjardins | 1, Complexe Desjardins, Montréal

Data Engineer Intern

@ Getinge | Wayne, NJ, US

Software Engineer III- Java / Python / Pyspark / ETL

@ JPMorgan Chase & Co. | Jersey City, NJ, United States

Lead Data Engineer (Azure/AWS)

@ Telstra | Telstra ICC Bengaluru