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OCR is All you need: Importing Multi-Modality into Image-based Defect Detection System
March 19, 2024, 4:43 a.m. | Chih-Chung Hsu, Chia-Ming Lee, Chun-Hung Sun, Kuang-Ming Wu
cs.LG updates on arXiv.org arxiv.org
Abstract: Automatic optical inspection (AOI) plays a pivotal role in the manufacturing process, predominantly leveraging high-resolution imaging instruments for scanning purposes. It detects anomalies by analyzing image textures or patterns, making it an essential tool in industrial manufacturing and quality control. Despite its importance, the deployment of models for AOI often faces challenges. These include limited sample sizes, which hinder effective feature learning, variations among source domains, and sensitivities to changes in lighting and camera positions …
abstract arxiv control cs.ai cs.cv cs.lg defect detection detection image imaging importance industrial industrial manufacturing making manufacturing ocr optical patterns pivotal process quality role tool type
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