Passive Micron-scale Time-of-Flight with Sunlight Interferometry. (arXiv:2211.10732v1 [cs.CV])

We introduce an interferometric technique for passive time-of-flight imaging
and depth sensing at micrometer axial resolutions. Our technique uses a
full-field Michelson interferometer, modified to use sunlight as the only light
source. The large spectral bandwidth of sunlight makes it possible to acquire
micrometer-resolution time-resolved scene responses, through a simple axial
scanning operation. Additionally, the angular bandwidth of sunlight makes it
possible to capture time-of-flight measurements insensitive to indirect
illumination effects, such as interreflections and subsurface scattering. We
build an …

arxiv micron scale