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Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE
June 21, 2024, 4:48 a.m. | Edith Heiter, Liesbet Martens, Ruth Seurinck, Martin Guilliams, Tijl De Bie, Yvan Saeys, Jefrey Lijffijt
cs.LG updates on arXiv.org arxiv.org
Abstract: This paper presents TRACE, a tool to analyze the quality of 2D embeddings generated through dimensionality reduction techniques. Dimensionality reduction methods often prioritize preserving either local neighborhoods or global distances, but insights from visual structures can be misleading if the objective has not been achieved uniformly. TRACE addresses this challenge by providing a scalable and extensible pipeline for computing both local and global quality measures. The interactive browser-based interface allows users to explore various embeddings …
abstract analyze artifact arxiv cs.gr cs.hc cs.lg dimensionality embedding embeddings generated global insights paper pattern quality through tool trace type visual
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